Checking Defects in Deep Learning AI Models

Kang Li Yan Zhang

Kang Li, Yan Zhang


Abstract

Although the core concept inside an deep learning AI model is common, currently there is no uniformed standard for representing AI models. Each popular DL framework, such as TensorFlow and Caffe2, uses its own formats. In addition, vendors, such as XiaoMi, Qualcomm, Tencent, all come up their own model formats. Most of DL framework and run-time systems make some sanity check to the AI models before loading them from applications. However, the properties being checked are ad-hoc. A framework or its run-time environment can load an AI model with defects or containing malformed neural networks.

This talk presents a static checker that find defects in AI models. The checker can detect flaws such as inconsistency of data dimensions, topology errors in neural networks. The checker also highlights the vendor specific content in AI models. We show that, such defects, if not detected, can cause damages to the run-time environments and cause security risks to deep learning applications. The danger to be shown in this presentation includes system hangs, crashes, and leak of critical application and user information. These flaws affect DL frameworks from well-known mobile vendors, and DL systems that support cloud-based AI services.

Speaker Info

Kang Li

Kang Li a professor of computer science and the director of the Institute for Cybersecurity and Privacy at the University of Georgia. His research results have been published at academic venues, such as IEEE S&P, ACM CCS, USENIX Security and NDSS, as well as industrial conferences, such as BlackHat, DEFCON, SyScan, and ShmooCon. Dr. Kang Li is the founder and mentor of multiple CTF security teams, including SecDawg and Blue-Lotus. He was also a founder and player of the Team Disekt, a finalist team in the 2016 DARPA Cyber Grand Challenge.

Yan Zhang

Yan Zhang is from 360 research, her interests are in the area of AI and cloud security. She led the 360 virtualization security team.

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